Predicate |
Object |
assignee |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_0e433c1625fc509a087c912b440da84b |
classificationCPCAdditional |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/C12Q2304-00 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R1-00 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H05K1-00 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L2221-00 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-00 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/C12Q1-00 |
classificationCPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R31-2886 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R31-2881 |
classificationIPCAdditional |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R1-00 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H05K1-00 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/C12Q1-00 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-00 |
classificationIPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-20 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-28 |
filingDate |
2013-01-02-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
grantDate |
2019-05-21-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
inventor |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_7fbe3987647fa641df328542f88716ca http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_38e1ea0ec401176abc77299ab616a9e3 |
publicationDate |
2019-05-21-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
publicationNumber |
US-10295591-B2 |
titleOfInvention |
Method and device for testing wafers |
abstract |
Circuits and methods for testing wafers are disclosed herein. An embodiment of a method includes electrically contacting a first probe and a second probe to a wafer. A gas is blown in the areas proximate the first probe and the second probe. An electric potential is then applied between the first probe and the second probe while the gas is being blown. |
priorityDate |
2013-01-02-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
type |
http://data.epo.org/linked-data/def/patent/Publication |