| Predicate |
Object |
| assignee |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_b9a255559e1d94f20510a17a673b1078 |
| classificationCPCAdditional |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/A61B2562-0238
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/A61B2562-0242
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/A61B2562-046
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/A61B2576-00
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/A61B2576-026
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G16H30-40 |
| classificationCPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G16C10-00
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/A61B5-0073
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/A61B5-0042
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/A61B5-0059
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/A61B5-0261 |
| classificationIPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/A61B5-026
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/A61B5-00
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G16C10-00 |
| filingDate |
2016-06-13-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| grantDate |
2019-05-21-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_b0632044ce5fa9861ce2bdcd30ea772a
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_fea4d3a6c65c1206ed02dcfe4b180544
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_f16d763233acd28999ca12819e506b3d
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_aad730e79ee1b32382f5426573e110ad |
| publicationDate |
2019-05-21-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber |
US-10292590-B2 |
| titleOfInvention |
Optical examination method and optical examination device |
| abstract |
A method of performing an optical examination on a test object and an optical examination device. The method includes obtaining a first detection light quantity distribution that is a detection light quantity distribution obtained for each of a plurality of optical models that simulate the test object, obtaining, using the optical sensor, a second detection light quantity distribution that is a distribution of an amount of light detected on the test object, and selecting based on the first light quantity distribution and the second detection light quantity distribution, an optical model suited to the test object from the plurality of optical models. The optical examination device includes an optical sensor, and a control system to control the irradiation system to obtain an amount of light detected by the detection system. |
| isCitedBy |
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-10768095-B2 |
| priorityDate |
2015-06-15-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type |
http://data.epo.org/linked-data/def/patent/Publication |