| Predicate |
Object |
| assignee |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_a073f3b136b8041b18fcca2f5c526f12
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_69b5b96e48cf960b530c7ca0a1c036cc
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_6303a6b69544a4c84049e9731f1e5489
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_786593e51818d1b41f5de2fb52f1a62e
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_22af29ed6ce61635b3b63e71e6d89cb1 |
| classificationCPCAdditional |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N2201-0826
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/A61B5-00 |
| classificationCPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/A61B5-0075
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/A61B5-0071
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N3-56
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N21-65
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/A61B5-0082 |
| classificationIPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N21-65
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N3-56
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/A61B5-00 |
| filingDate |
2017-05-30-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| grantDate |
2019-04-16-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_0e02c150ae5ef91cf1f5700346b43513
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_c83157177250247da44f5c3a4d3ad6c6
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_0f46b0c225d07f6518acfaecf6d822f5
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_0cfddb8ec726f3c31e566cbd2b38e265
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_00a6c04914bbcdc4341a884db527595a |
| publicationDate |
2019-04-16-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber |
US-10258239-B2 |
| titleOfInvention |
Method for in-line testing and surface analysis of test material with participation of raman spectroscopy |
| abstract |
Proposed is a method for in-line testing and surface analysis of test material with participation of Raman spectroscopy wherein the apparatus has a column with a plurality of test units at least one of which is a wear test unit and another is a Raman spectrometer. The sample is located on a rotary table under the test units. By sequentially removing the material of the sample to a predetermined depth and then conducting the surface analysis with the use of the Raman spectrometer, it becomes possible to analyze distribution of the material components in the depth direction from the surface of the sample. delivery beams to the longitudinal axis of the Raman spectrometer |
| priorityDate |
2017-05-30-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type |
http://data.epo.org/linked-data/def/patent/Publication |