http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-10247659-B2

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filingDate 2015-04-24-04:00^^<http://www.w3.org/2001/XMLSchema#date>
grantDate 2019-04-02-04:00^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_fdfd9c3b7a8434df43d4b5aa8bfec794
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publicationDate 2019-04-02-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber US-10247659-B2
titleOfInvention Device for characterizing an interface of a structure and corresponding device
abstract The present invention relates to a device ( 1 ) for characterizing an interface of a structure ( 6 ), said structure ( 6 ) comprising a solid first material and a second material, the materials being separated by said interface. The device ( 1 ) comprises:n means ( 2 ) for generating a first mechanical wave; means ( 2 ) for forming Brillouin oscillations; means ( 10 ) for detecting time variation of the Brillouin oscillations; means ( 12 ) for responding to the time variation of the Brillouin oscillations to identify reflection of said first mechanical wave by said interface or transmission through said interface of a second mechanical wave interfering with the first mechanical wave; and means ( 13 ) for determining the variation in amplitude of the Brillouin oscillations before and after reflection or transmission by said interface. nn The invention also relates to a corresponding method of characterization.
priorityDate 2014-04-30-04:00^^<http://www.w3.org/2001/XMLSchema#date>
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