| Predicate |
Object |
| assignee |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_2a6a9431aa1fe5109ca95ad4e332231b
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_57df0e0c09f1cb88ba7cd9eaa32181fc
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_6fe7d4f5fda2be28c5f85fe7269f1d1a
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_f735884afad390f2f6e8bc6d129fb1ff |
| classificationCPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R31-2656
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R31-309
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R1-071 |
| classificationIPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-26
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R1-07
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-311
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-28
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-265 |
| filingDate |
2015-03-19-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| grantDate |
2019-01-08-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_d7901090b37e152dca5ecb3bc37be09d
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_75e56ff10b53a7905c100a7095a7ea11
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_2788b043d67ed6c058d03f6f1abfd85c |
| publicationDate |
2019-01-08-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber |
US-10175266-B1 |
| titleOfInvention |
Wafer level electrical probe system with multiple wavelength and intensity illumination capability system |
| abstract |
A wafer level electrical probe system with multiple wavelength and intensity illumination capability system that enables concurrent reliability studies of illumination stimulation, electrical stimulation, and the interplay of both electrical and illumination stimulation. The probe system includes five sub-systems: a controllable wavelength and intensity illumination input sub-system with two different configurations; a wafer level electrical probe sub-system; an illumination intensity calibration sub-system; an illumination delivery sub-system; and an illumination wavelength calibration sub-system. |
| isCitedBy |
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/CN-112415239-A
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-11047795-B2 |
| priorityDate |
2014-04-11-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type |
http://data.epo.org/linked-data/def/patent/Publication |