| Predicate |
Object |
| assignee |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_c3a2f00e72ba6e4c09b6da573427fbed |
| classificationCPCAdditional |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G11C2207-2254 |
| classificationCPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G11C29-022
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G11C7-1057
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G11C29-025
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G11C29-028
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G11C29-50008
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H03K19-0005
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H03K19-017545
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G11C7-1084
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H03K19-003
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G11C11-4094
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G11C11-4093 |
| classificationIPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G11C11-4094
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H03K19-00
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G11C11-4093
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G11C29-02
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H03K19-0175
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H03K19-003 |
| filingDate |
2018-02-21-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| grantDate |
2018-10-02-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_36c48d8a82f78e0c287590818a3a3425 |
| publicationDate |
2018-10-02-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber |
US-10090836-B1 |
| titleOfInvention |
Methods and systems for averaging impedance calibration |
| abstract |
A semiconductor device also includes programmable termination components and a calibration circuit. The calibration circuit generates impedance calibration codes. The calibration circuit also calibrates impedance of the programmable termination components based on an average impedance calibration code of the impedance calibration codes. The semiconductor device further includes an averaging circuit that determines the average impedance calibration code of the impedance calibration codes. |
| isCitedBy |
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-10256817-B2 |
| priorityDate |
2017-07-19-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type |
http://data.epo.org/linked-data/def/patent/Publication |