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filingDate 2016-09-06-04:00^^<http://www.w3.org/2001/XMLSchema#date>
grantDate 2018-10-02-04:00^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_d95da27a45964a34ff6f2d58e42ee8b7
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publicationDate 2018-10-02-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber US-10090195-B2
titleOfInvention Method including a formation of a diffusion barrier and semiconductor structure including a diffusion barrier
abstract A method includes forming a diffusion barrier over a semiconductor structure. The formation of the diffusion barrier includes performing a first tantalum deposition process, the first tantalum deposition process forming a first tantalum layer over the semiconductor structure, performing a treatment of the first tantalum layer, and performing a second tantalum deposition process after the treatment of the first tantalum layer. The treatment modifies at least a portion of the first tantalum layer. The second tantalum deposition process forms a second tantalum layer over the first tantalum layer.
priorityDate 2015-10-21-04:00^^<http://www.w3.org/2001/XMLSchema#date>
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