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publicationDate 2018-08-07-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber US-10043904-B2
titleOfInvention Method and structure of improving contact resistance for passive and long channel devices
abstract A semiconductor device includes a gate arranged on a substrate; a source/drain formed on the substrate adjacent to the gate; a source/drain contact extending from the source/drain and through an interlayer dielectric (ILD) over the source/drain, a portion of the source/drain positioned adjacent to the source/drain contact; and a silicide positioned along a sidewall of the source/drain contact between the portion of the source/drain and the source/drain contact, and along an endwall of the source/drain contact between the source/drain contact and the substrate.
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