http://rdf.ncbi.nlm.nih.gov/pubchem/patent/TW-M527545-U
Outgoing Links
| Predicate | Object |
|---|---|
| assignee | http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_c95525e560a3febf35f67262dee74ada |
| classificationIPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-26 |
| filingDate | 2016-05-24-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor | http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_f09a4b696d8bebaacbaa5803701ea27e http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_8ed89851e028222d25335ee0fc0ad593 http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_0e06ce20c78ebb1f07f25029f1d459e0 |
| publicationDate | 2016-08-21-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber | TW-M527545-U |
| titleOfInvention | Ball gate array test device |
| abstract | The present utility model provides a ball grid array testing apparatus, including: a socket, which is used for supporting a device under test to receive a testing signal from the device under test; a load board; and a fin substrate, which is disposed between the socket and the load board, wherein the fin substrate is electrically connected with the socket and the load board for receiving the testing signal transmitted from the socket to fan out the testing signal. The device to be tested is a BGA electronic device having a plurality of tin balls at its bottom. A distance between the tin balls can be smaller than 0.4 mm. |
| isCitedBy | http://rdf.ncbi.nlm.nih.gov/pubchem/patent/TW-I770523-B |
| priorityDate | 2016-05-24-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type | http://data.epo.org/linked-data/def/patent/Publication |
Incoming Links
| Predicate | Subject |
|---|---|
| isDiscussedBy | http://rdf.ncbi.nlm.nih.gov/pubchem/substance/SID419524915 http://rdf.ncbi.nlm.nih.gov/pubchem/compound/CID5352426 |
Total number of triples: 15.