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publicationDate 2021-10-11-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber TW-I742390-B
titleOfInvention Pattern forming method of semiconductor device and method of manufacturing semiconductor devices
abstract In accordance with an aspect of the present disclosure, in a pattern forming method for a semiconductor device, a first opening is formed in an underlying layer disposed over a substrate. The first opening is expanded in a first axis by directional etching to form a first groove in the underlying layer. A resist pattern is formed over the underlying layer. The resist pattern includes a second opening only partially overlapping the first groove. The underlying layer is npatterned by using the resist pattern as an etching mask to form a second groove.
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