http://rdf.ncbi.nlm.nih.gov/pubchem/patent/TW-I704347-B
Outgoing Links
| Predicate | Object |
|---|---|
| assignee | http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_3b92609c425eaed9bfd02bb7a3a168c5 |
| classificationCPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N30-7206 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N30-8668 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N30-02 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N25-4826 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N30-72 |
| classificationIPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N30-72 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01J49-04 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01J49-10 |
| filingDate | 2016-10-13-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| grantDate | 2020-09-11-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor | http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_254d4adfcc7bdcd635d8d55489cb3c36 http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_221e6905bde9f9e6b10c70e46783cb2f http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_a112fd00993ab3f67b7b97d23f76f064 http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_2df11d8990d3d6cd3cc91078ac4d11f0 http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_aae8c349718c2f51d760b41d0ea34e10 |
| publicationDate | 2020-09-11-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber | TW-I704347-B |
| titleOfInvention | Generated gas analysis method and generated gas analysis device |
| abstract | The generated gas analysis device includes: a sample holder, a heating unit that heats the sample to generate gas components, an ion source that ionizes the gas components to generate ions, a mass analyzer that analyzes the quality of the ions and detects the gas components, the supply of gas components, and The gas flow path through which the mixed gas of the carrier gas guided by the mass analyzer circulates. The gas analysis method includes: discharge flow adjustment program to adjust the discharge flow rate of the mixed gas in the branch path to the outside; cooling program to keep the sample The device contacts the cooling part to cool it; the correction program uses a standard sample containing gas components as the measurement object, (1) corrects the spectral position of the mass spectrum, (2) calculates the sensitivity correction coefficient Cs=Ss/S, (3) The heating correction coefficient H=t/ts that corrects the heating rate of the sample in the heating section when the gas composition of the actual sample is measured is calculated. |
| priorityDate | 2015-11-20-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type | http://data.epo.org/linked-data/def/patent/Publication |
Incoming Links
Total number of triples: 36.