http://rdf.ncbi.nlm.nih.gov/pubchem/patent/TW-I687671-B

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filingDate 2016-06-01-04:00^^<http://www.w3.org/2001/XMLSchema#date>
grantDate 2020-03-11-04:00^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_dc90ffac9983a75b353d13b0760e642c
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publicationDate 2020-03-11-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber TW-I687671-B
titleOfInvention Method for preparing a sample for microstructure diagnostics, and sample for microstructure diagnostics
abstract The present invention relates to a method for preparing a sample for microstructure diagnosis, which includes the following steps: (a) The sample body is released by at least one laser beam incident perpendicularly and/or obliquely to the substrate surface by means of at least one laser processing operation, so that The shape of the sample body: the shape has at least one sturdy operation section and a target section that is thinner than the operation section bordering the operation section; (b) manufacturing a sample body holder separate from the sample body , Which has an accommodating structure matching the shape of the sample body to accommodate the sample body in a defined accommodating position; (c) removing the released sample body from the substrate; (d) removing the sample body from the substrate Fixed at the receiving structure of the sample body holder; (e) performing at least one additional material etching process on at least one side of the sample body in the region of the target section by means of laser beam and/or ion beam processing to expose Target section.
priorityDate 2015-06-05-04:00^^<http://www.w3.org/2001/XMLSchema#date>
type http://data.epo.org/linked-data/def/patent/Publication

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Total number of triples: 29.