http://rdf.ncbi.nlm.nih.gov/pubchem/patent/TW-I684017-B
Outgoing Links
| Predicate | Object |
|---|---|
| assignee | http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_6af1aac0717028a45913e80d9e05fad8 |
| classificationIPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-26 |
| filingDate | 2018-02-13-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| grantDate | 2020-02-01-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor | http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_5d4d270a1a75f927ae651b1f8d555287 http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_0465c89e549501a80bd9f781fad1a19e http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_2f1f2aa87ff35ff9f8d67222997fb7c4 http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_83e23e1923a0c7a590971285e3f8e677 http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_b5603294480bf20e95e3be19f25260ae |
| publicationDate | 2020-02-01-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber | TW-I684017-B |
| titleOfInvention | Bump testing apparatus and method |
| abstract | A bump testing method is provided, including measuring the height of a plurality of conductive bumps disposed on a substrate structure, removing a portion of the conductive bumps, and conducting a thrust experiment, to allow all the conducive bumps to have the same height. The bump testing method conducts the thrust experiment on all of the conductive bumps at the same time, and the required to conduct the test is greatly reduced. The present invention also provides a bump testing apparatus. |
| priorityDate | 2018-02-13-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type | http://data.epo.org/linked-data/def/patent/Publication |
Incoming Links
Total number of triples: 18.