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filingDate 2017-11-30-04:00^^<http://www.w3.org/2001/XMLSchema#date>
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publicationDate 2019-08-11-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber TW-I668735-B
titleOfInvention Semiconductor device and method of manufacturing same
abstract A method for reducing line distortion includes forming a first patterned layer over a metal component, and depositing a first masking layer over the first patterned layer. The first masking layer is patterned to form one or more openings therein, and the first masking layer is thinned. The pattern of the first masking layer is transferred to the first patterned layer to form one or more openings in the second group therein. The first patterned layer may be composed of a silicon or oxide material. When the mask layer is above the first patterned layer, the opening in the first patterned layer may be widened.
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