http://rdf.ncbi.nlm.nih.gov/pubchem/patent/TW-I662593-B

Outgoing Links

Predicate Object
assignee http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_2a3bb4ae410da4be8184239adc5ab1c0
classificationCPCInventive http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-0228
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L29-517
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-31144
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-31111
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-31122
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-0335
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-0337
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-02183
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-3065
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-76829
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-02172
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-0332
classificationIPCInventive http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-033
filingDate 2017-01-25-04:00^^<http://www.w3.org/2001/XMLSchema#date>
grantDate 2019-06-11-04:00^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_32ea20e2cb4e9b5004dae6b3d9e0de15
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_a607da87afe96d7d5e2b6f62f42a77fe
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_dad362e41b94ffc328d120b0c0066a35
publicationDate 2019-06-11-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber TW-I662593-B
titleOfInvention Semiconductor component manufacturing method
abstract An etch stop layer including a metal oxide, the metal oxide packagenIt includes metals selected from the group consisting of Group 4 metals of the periodic table, Group 5 metals of the periodic table, Group 6 metals of the periodic table, and yttrium. Metal oxides form a particularly thin layer that is resistant to ashing and HF exposure. Subjecting the etch stop layer to both ashing and HF etch methods to remove etch stop layers having a thickness of less than 0.3 nm, and more preferably to remove etch stop layers having a thickness of less than 0.25 nm. The etch stop layer may be thin and may have a thickness of about 0.5 nm to 2 nm. In some embodiments, the etch stop layer includes tantalum oxide (TaO).
priorityDate 2016-01-26-04:00^^<http://www.w3.org/2001/XMLSchema#date>
type http://data.epo.org/linked-data/def/patent/Publication

Incoming Links

Predicate Subject
isDiscussedBy http://rdf.ncbi.nlm.nih.gov/pubchem/compound/CID9989226
http://rdf.ncbi.nlm.nih.gov/pubchem/substance/SID451818717
http://rdf.ncbi.nlm.nih.gov/pubchem/substance/SID419549336
http://rdf.ncbi.nlm.nih.gov/pubchem/substance/SID458437476
http://rdf.ncbi.nlm.nih.gov/pubchem/substance/SID419577789
http://rdf.ncbi.nlm.nih.gov/pubchem/substance/SID419559562
http://rdf.ncbi.nlm.nih.gov/pubchem/substance/SID419523855
http://rdf.ncbi.nlm.nih.gov/pubchem/compound/CID977
http://rdf.ncbi.nlm.nih.gov/pubchem/substance/SID447945359
http://rdf.ncbi.nlm.nih.gov/pubchem/compound/CID6547
http://rdf.ncbi.nlm.nih.gov/pubchem/substance/SID414859283
http://rdf.ncbi.nlm.nih.gov/pubchem/substance/SID457280313
http://rdf.ncbi.nlm.nih.gov/pubchem/compound/CID123279
http://rdf.ncbi.nlm.nih.gov/pubchem/compound/CID23993
http://rdf.ncbi.nlm.nih.gov/pubchem/substance/SID419559503
http://rdf.ncbi.nlm.nih.gov/pubchem/compound/CID24394
http://rdf.ncbi.nlm.nih.gov/pubchem/compound/CID23990
http://rdf.ncbi.nlm.nih.gov/pubchem/compound/CID90455
http://rdf.ncbi.nlm.nih.gov/pubchem/compound/CID14917
http://rdf.ncbi.nlm.nih.gov/pubchem/compound/CID62157
http://rdf.ncbi.nlm.nih.gov/pubchem/substance/SID419523291

Total number of triples: 46.