| Predicate |
Object |
| assignee |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_36333273e27f0db23ddddbf80ba79ba7 |
| classificationIPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-26
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R1-20 |
| filingDate |
2017-08-18-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| grantDate |
2019-04-21-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_613eab4491102f03821c341838044e1e
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_5c02281c76d6341831f4c2de1ee7d4c4
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_b46c3a2329c34dd01b7551f0c9f1a697 |
| publicationDate |
2019-04-21-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber |
TW-I657251-B |
| titleOfInvention |
Semiconductor test device, semiconductor test system, and semiconductor test method |
| abstract |
The present disclosure provides a semiconductor testing device comprising: a substrate; a gold finger contact structure disposed on one side of the substrate. |
| priorityDate |
2017-08-18-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type |
http://data.epo.org/linked-data/def/patent/Publication |