http://rdf.ncbi.nlm.nih.gov/pubchem/patent/TW-I652822-B

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filingDate 2014-05-30-04:00^^<http://www.w3.org/2001/XMLSchema#date>
grantDate 2019-03-01-04:00^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_21747acfb77b0d181ab4dff0d66658d4
publicationDate 2019-03-01-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber TW-I652822-B
titleOfInvention Oxide semiconductor film and method of forming same
abstract One of the objects of one embodiment of the present invention is to provide a crystalline oxide semiconductor film. One aspect of the present invention is a method for producing an oxide semiconductor film, comprising the steps of sequentially laminating a gallium atom, a zinc atom, and an oxygen by causing an ion to collide with a target containing a crystalline In-Ga-Zn oxide. a first layer of atoms, a second layer containing indium atoms and oxygen atoms, and a plate-like crystalline In-Ga-Zn oxide containing a third layer of gallium atoms, zinc atoms, and oxygen atoms; and a flat In The -Ga-Zn oxide is irregularly deposited on the substrate while maintaining crystallinity.
priorityDate 2013-06-19-04:00^^<http://www.w3.org/2001/XMLSchema#date>
type http://data.epo.org/linked-data/def/patent/Publication

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