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filingDate 2016-12-26-04:00^^<http://www.w3.org/2001/XMLSchema#date>
grantDate 2018-10-01-04:00^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_445c7c2bc82ab9456d93275a59dd9b86
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publicationDate 2018-10-01-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber TW-I637072-B
titleOfInvention Cleaning method of SiC single crystal growth furnace
abstract The cleaning method of the SiC single crystal growth furnace of the present invention is a method of using a gas to clean a SiC single crystal growth furnace provided with a substrate in a chamber. The substrate in the chamber has at least the surface of (111) in powder XRD analysis. The 3C-SiC polycrystal whose surface has a strength ratio of 85% to 100% relative to other crystal surfaces. The cleaning method is to make a mixed gas of at least one of fluorine gas, inert gas and air in a non-plasma state. Those who circulate through the SiC single crystal growth furnace and selectively remove the SiC deposits deposited in the SiC single crystal growth furnace, the mixed gas system consists of 1% by volume to 20% by volume of fluorine gas and 80% by volume The temperature in the SiC single crystal growth furnace is 200 ° C to 500 ° C.
priorityDate 2015-12-28-04:00^^<http://www.w3.org/2001/XMLSchema#date>
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