http://rdf.ncbi.nlm.nih.gov/pubchem/patent/TW-I633650-B

Outgoing Links

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assignee http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_6b822ee046eb6c45d1e3bd9ce9c1782e
classificationCPCAdditional http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L27-0705
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classificationCPCInventive http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L29-78606
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L29-78696
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H10B41-41
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H10B41-60
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classificationIPCInventive http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L29-78
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L27-115
filingDate 2014-06-16-04:00^^<http://www.w3.org/2001/XMLSchema#date>
grantDate 2018-08-21-04:00^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_aa07e0c99c24a951a9ae29a1ca0eb12f
publicationDate 2018-08-21-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber TW-I633650-B
titleOfInvention Semiconductor device
abstract An object of the present invention is to provide a semiconductor device excellent in charge retention characteristics. As a transistor for connecting the gate to the node for holding electric charge, a transistor including a thick gate insulating film to reduce leakage current is separately provided. The charge corresponding to the material is held in the node by using the separately provided transistor and a transistor in which the oxide semiconductor is used for the semiconductor layer including the semiconductor layer of the channel formation region.
priorityDate 2013-06-21-04:00^^<http://www.w3.org/2001/XMLSchema#date>
type http://data.epo.org/linked-data/def/patent/Publication

Incoming Links

Predicate Subject
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http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-2006113565-A1
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Total number of triples: 27.