Predicate |
Object |
assignee |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_31da94917d1067c89f7e22444c88a836 |
classificationCPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L27-0676 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L29-8613 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L27-0629 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L27-0255 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L22-34 |
classificationIPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-30 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-28 |
filingDate |
2015-05-29-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
grantDate |
2017-05-21-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
inventor |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_3aceedca585841905e1a5da4ade91a71 http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_e0710f0796091c9923430145e70bde53 |
publicationDate |
2017-05-21-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
publicationNumber |
TW-I583978-B |
titleOfInvention |
Integrated circuit with test structure including bidirectional protective diode |
priorityDate |
2014-10-24-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
type |
http://data.epo.org/linked-data/def/patent/Publication |