| Predicate |
Object |
| assignee |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_31da94917d1067c89f7e22444c88a836 |
| classificationCPCAdditional |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G11C2029-5002 |
| classificationCPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R31-2881
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R31-31816
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R31-002
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G11C29-50
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G11C29-50016
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G11C11-4125 |
| classificationIPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N21-84 |
| filingDate |
2013-10-07-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| grantDate |
2016-07-11-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_9b5ab5dd7d8f3be758cba5197e272132
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_873c09ace1b777aafcd98cee62c971a9 |
| publicationDate |
2016-07-11-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber |
TW-I541497-B |
| titleOfInvention |
Method for measuring soft error induced by alpha particles in a semiconductor device |
| priorityDate |
2013-01-22-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type |
http://data.epo.org/linked-data/def/patent/Publication |