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classificationIPCInventive http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-768
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-31
filingDate 2008-08-27-04:00^^<http://www.w3.org/2001/XMLSchema#date>
grantDate 2013-09-21-04:00^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_6b09cc900928844470b4cd9389a6ab7b
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_bc6eb1706e541980e08a230d9f627f5e
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publicationDate 2013-09-21-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber TW-I409880-B
titleOfInvention Method for manufacturing a semiconductor device
abstract A method for manufacturing a semiconductor device is disclosed. A semiconductor substrate such as bare silicon is provided, and a dielectric layer is formed over the semiconductor substrate. An opening is provided within the dielectric layer by removing a portion of the dielectric layer. A conformal first conductive layer is formed over the dielectric layer and the opening. A conformal second conductive layer is formed over the first conductive layer. A conformal barrier is formed over the second conductive layer.
priorityDate 2008-08-27-04:00^^<http://www.w3.org/2001/XMLSchema#date>
type http://data.epo.org/linked-data/def/patent/Publication

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