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publicationDate 2006-07-11-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber TW-I258200-B
titleOfInvention Back end of line integration scheme
abstract A semiconductor structure comprises: a first inter-layer dielectric (ILD) over a substrate; a first metal layer; a plurality of second ILDs over the first ILD; and a plurality of second metal layers, each of the second metal layers is over one of the second ILDs. The first ILD is not cured. It has a k value of between about 2.5 and 3.0, a pore size of smaller than about 10 Å, and hardness of larger than about 1.5 Gpa. The semiconductor structure has reduced plasma charge from plasma curing.
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