http://rdf.ncbi.nlm.nih.gov/pubchem/patent/TW-I257705-B
Outgoing Links
| Predicate | Object |
|---|---|
| assignee | http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_8bd7a45a343acd10e3f5d8775dda2157 |
| classificationIPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L31-00 |
| filingDate | 2003-09-19-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| grantDate | 2006-07-01-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor | http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_2b0e1b83acde76919f4ebb8aa67c147c http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_fc3c4aba52a50cd6b6e3387b4afe9a74 http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_62807118a2c1d029a0f3797b92e06761 |
| publicationDate | 2006-07-01-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber | TW-I257705-B |
| titleOfInvention | Device of detecting nanoparticle and method of the same |
| abstract | A mass spectrometry system includes a first ion trap that selectively ejects charged particles based on their mass-to-charge ratios. A second ion trap receives the particles ejected from the first ion trap, causing the particles to gather near the center of the second ion trap. A laser beam is directed towards the particles in the second ion trap to induce fluorescence, which is detected by the photon detector. Particles are periodically dumped from the second ion trap. A mass spectrum of the charged particles can be obtained by comparing the photon count with the particle ejection characteristics of the first ion trap. |
| priorityDate | 2003-09-19-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type | http://data.epo.org/linked-data/def/patent/Publication |
Incoming Links
Total number of triples: 25.