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http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L29-772
filingDate 2005-09-29-04:00^^<http://www.w3.org/2001/XMLSchema#date>
grantDate 2006-05-11-04:00^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_3db084b30f8764c2049d03ffc876a0a7
publicationDate 2006-05-11-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber TW-I255044-B
titleOfInvention SOI MOSFET device with reduced polysilicon loading on active area
abstract Silicon-on-insulator (SOI) devices with reduced polysilicon loading on an active area uses at least one dielectric layer resistant to silicidation to separate at least one body contact region from source/drain regions, thus reducing gate capacitance and improving device performance. The SOI devices may be used in full depletion type transistor or partial depletion type transistor.
priorityDate 2005-02-08-04:00^^<http://www.w3.org/2001/XMLSchema#date>
type http://data.epo.org/linked-data/def/patent/Publication

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