http://rdf.ncbi.nlm.nih.gov/pubchem/patent/TW-I249040-B
Outgoing Links
| Predicate | Object |
|---|---|
| assignee | http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_3d5b19bd47471b2083ccb2c9b29926dd |
| classificationIPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G12B13-00 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01B9-00 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G02B21-00 |
| filingDate | 2004-07-23-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| grantDate | 2006-02-11-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor | http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_9d152416155395d24970f4491ca5c51f http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_91a250584f902a90b8588b66633b64d1 http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_31b3b8e6e1d1f32ab3c80036aa0ddb4b http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_eec97c64061e354a6d02a630b6694f09 |
| publicationDate | 2006-02-11-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber | TW-I249040-B |
| titleOfInvention | Optical nano calibration standard |
| abstract | The invention using test standard at nanometer scale is setting up from the pattern of the interference of the optical evanescent wave. The testing standard can be the base of calibration for the nonlinear response of the scanning piezo-tube that used in near-field scanning optical microscope (NFSOM). The present invention is to provide that system can be adjusted to the scale of nanometer without any complicated and expensive process on making sample of testing standard. |
| priorityDate | 2004-07-23-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type | http://data.epo.org/linked-data/def/patent/Publication |
Incoming Links
Total number of triples: 25.