Predicate |
Object |
assignee |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_38ed56a4b4e8e2315b2b3308bffedb3f |
classificationCPCAdditional |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L2924-0002 |
classificationCPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-02274 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-31629 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-76835 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-7684 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/C23C16-401 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-02126 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-02131 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L23-5329 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-02211 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-76802 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-31633 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-76807 |
classificationIPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-76 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L23-58 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L23-532 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-316 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-31 |
filingDate |
2004-11-23-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
grantDate |
2005-08-11-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
inventor |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_f9e8e1197f151f99009f6954ad413bda http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_060e785d27bab054d2a0986a4f145296 http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_6b97ced22f030b74dd2bf5e62fc18d72 http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_b06a400eae080d0e14452f29735ad540 http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_2f3c97d8cb3114cf9c8349181c60fa9b |
publicationDate |
2005-08-11-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
publicationNumber |
TW-I237868-B |
titleOfInvention |
Method for fabricating a dielectric layer |
abstract |
A method for fabricating a dielectric layer is to dope carbon and halogen to silicate glass. The dielectric constant of the dielectric layer can be lowered and its mechanical characteristics are better. By introducing an organosilane and a silicon halide into a CVD chamber, which is controlled within preferred range of temperature, pressure and RF power, the dielectric constant is controlled under 3.3. The Hardness and Modulus of the dielectric layer is better than that of conventional materials. |
priorityDate |
2003-12-04-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
type |
http://data.epo.org/linked-data/def/patent/Publication |