http://rdf.ncbi.nlm.nih.gov/pubchem/patent/TW-541428-B
Outgoing Links
| Predicate | Object |
|---|---|
| assignee | http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_c2521554413e78a1085be4e110ced38d |
| classificationIPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-26 |
| filingDate | 2001-06-14-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| grantDate | 2003-07-11-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor | http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_ec5a4ed083e970c5a7b0e80d42765d25 |
| publicationDate | 2003-07-11-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber | TW-541428-B |
| titleOfInvention | Electrical characteristic detection method of silicon based liquid crystal panel |
| abstract | There is provided an electrical characteristic detection method of silicon based liquid crystal panel, which comprises: first, enabling a scan line, detecting the resistance between a data line and the adjacent data line, and displaying that the two adjacent pixels on the scan line are short-circuited when the measured result is a low resistance smaller than a predefined resistance; in addition, enabling a scan line and inputting a signal from a data line; next, enabling another adjacent scan line and inputting another signal from the data line; then, inputting the original signal from the data line; and finally, enabling the scan line, wherein two adjacent pixels on the same data line are short-circuited if there is a voltage drift on the data line. |
| priorityDate | 2001-06-14-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type | http://data.epo.org/linked-data/def/patent/Publication |
Incoming Links
Total number of triples: 15.