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filingDate 2001-06-04-04:00^^<http://www.w3.org/2001/XMLSchema#date>
grantDate 2002-04-21-04:00^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_7fd1298a04fd7cc746bfaa0f08cc118a
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publicationDate 2002-04-21-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber TW-483800-B
titleOfInvention Diamond as a polish-stop layer for chemical-mechanical planarization in a damascene process flow
abstract A method of using diamond or a diamond-like carbon layer as a polish-stop for patterning a metal level into an inter-level dielectric substrate using a damascene process flow. The diamond or a diamond-like carbon layer is deposited onto the surface of the substrate before patterning the metal level. A protective layer is then deposited over the diamond or diamond-like carbon polish-stop layer, wherein such protective layer may act as an additional polish-stop layer. Together, the diamond or diamond-like carbon polish-stop layer and the protective layer are used as a hard-mask for patterning the trenches that will become the metal features, wherein such protective layer protects the diamond or diamond-like carbon polish-stop layer during the patterning process. After deposition of a conductive metal layer, the dielectric substrate is polished to remove excess conductive material, as well as topography. In the polishing process, the diamond or diamond-like carbon polish-stop layer and any remaining protective layer are used as polish-stop layers. The diamond or diamond-like carbon polish-stop layer allows for an improved planar surface, thereby resulting in an sufficient decrease in topography at the surface of the inter-level dielectric.
isCitedBy http://rdf.ncbi.nlm.nih.gov/pubchem/patent/CN-103909464-A
priorityDate 2000-06-07-04:00^^<http://www.w3.org/2001/XMLSchema#date>
type http://data.epo.org/linked-data/def/patent/Publication

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