http://rdf.ncbi.nlm.nih.gov/pubchem/patent/TW-432677-B

Outgoing Links

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http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L27-04
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L27-108
filingDate 1999-06-08-04:00^^<http://www.w3.org/2001/XMLSchema#date>
grantDate 2001-05-01-04:00^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_a83784bb19e721c794429e59286c1d5e
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publicationDate 2001-05-01-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber TW-432677-B
titleOfInvention Trench-capacitor with isolation-collar and its production method
abstract This invention designs a trench-capacitor (160), which can be used in a memory-cells (100). Said trench-capacitor (160) is formed in a substrate (101) and is composed of: a trench (108) with an upper region (109) and a lower region (111); an isolation-collar (168), which is formed in the upper region (109) of a trench (108); a buried tub (170), which is formed from the lower region (111) of the trench (108); a buried plate (165), acted as a capacitor outer-electrode, which is formed around the lower region (111) of the trench (108); a dielectric layer (164), acted as a capacitor-dielectric to cover the lower region (111) of the trench (108) and of the isolation-collar (168); a conductive trench-filling (161), which is filled in the trench (108) and forms the inner capacitor-electrode; a buried contact (250), which is formed in the substrate (101); wherein the buried contact (250) is formed through implantation, plasma-doping and/or gas-phase-doping. Preferably a tunnel-layer (205) composed of oxide-, nitride- or oxynitride is formed on the boundary (201) of the buried contacts (250).
priorityDate 1998-06-15-04:00^^<http://www.w3.org/2001/XMLSchema#date>
type http://data.epo.org/linked-data/def/patent/Publication

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Total number of triples: 26.