http://rdf.ncbi.nlm.nih.gov/pubchem/patent/TW-418504-B

Outgoing Links

Predicate Object
assignee http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_57341227c065dbddd1d3cf801bbaa86a
classificationIPCInventive http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-768
filingDate 1997-11-26-04:00^^<http://www.w3.org/2001/XMLSchema#date>
grantDate 2001-01-11-04:00^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_457f4050fee9643a57e58f4d5fd6179b
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_5ebe00cb1530d0c195c8336a23ace567
publicationDate 2001-01-11-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber TW-418504-B
titleOfInvention Method of reducing pin holes in a silicon nitride passivation layer
abstract The present invention uses a pre-treatment to remove the organic metal on an interconnect. The reaction gas is NH3 and N2O. The gas pressure of the process is about 2.5 torrs. The power of plasma is about 100 watts. The clearance of the susceptors is about 450 mils. The flowrates of the gases NH3 and N2O, separately, are 100 sccm and 1600 sccm. A thin layer of oxide is formed on the interconnect. The gas pressure of the process is about 2.5 torrs. The power of deposition is about 240 watts within the range of power frequency. The clearance of the susceptors is about 430 mils. The flowrate of the reaction gas N2O is 1600 sccm. The flowrate of the reaction gas SiH4 is 90 sccm. A silicon nitride layer is formed on the oxide layer as a passivation layer by a chemical vapor deposition process. The gas pressure of the process is about 3.35 torrs. The power of deposition is about 760 watts. The clearance of the susceptors is about 650 mils. The reaction gases are SiH4 and NH3. Pin holes in the passivation layer can be effectively removed by using the processing parameters in the present process.
priorityDate 1997-11-26-04:00^^<http://www.w3.org/2001/XMLSchema#date>
type http://data.epo.org/linked-data/def/patent/Publication

Incoming Links

Predicate Subject
isDiscussedBy http://rdf.ncbi.nlm.nih.gov/pubchem/compound/CID3084099
http://rdf.ncbi.nlm.nih.gov/pubchem/substance/SID419522015

Total number of triples: 14.