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classificationIPCInventive http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-768
filingDate 1999-06-14-04:00^^<http://www.w3.org/2001/XMLSchema#date>
grantDate 2000-11-01-04:00^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_9dfce7a0650570c72018819595023d6d
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_9fe33f7fbb46bb9f612c76dd63259caf
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publicationDate 2000-11-01-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber TW-410432-B
titleOfInvention Method for forming bonding pad
abstract A method for forming a bonding pad is provided. The method includes forming a first metal layer on a semiconductor substrate with integrated circuits. A second metal layer is formed on the first metal layer, wherein the second metal layer includes only one kind of metal material. An anti-reflective layer is formed on the second metal layer. A dielectric layer for protecting is formed on the anti-reflective layer. Finally, the dielectric layer and the anti-reflective layer are defined by mask for being etched off so as to form an etching opening for forming metal interconnect, whereby the corrosion of the first metal layer is reduced by the protection of the second metal layer.
priorityDate 1999-06-14-04:00^^<http://www.w3.org/2001/XMLSchema#date>
type http://data.epo.org/linked-data/def/patent/Publication

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