http://rdf.ncbi.nlm.nih.gov/pubchem/patent/TW-396485-B
Outgoing Links
| Predicate | Object |
|---|---|
| assignee | http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_c16d2144a81bfa32a665dca1e93c3d37 |
| classificationCPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R31-2886 |
| classificationIPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-28 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-26 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H05K13-08 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H05K1-11 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R1-073 |
| filingDate | 1998-07-21-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| grantDate | 2000-07-01-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor | http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_c9a846bbe810bca1a471b2944b6b558e http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_42ac6c3eb054dcbc51d5eb272516208f |
| publicationDate | 2000-07-01-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber | TW-396485-B |
| titleOfInvention | Probe card for testing integrated circuit chip |
| abstract | There is provided a probe card for the test of integrated circuit (IC) chip which is used in testing the electrical characteristics of at least two Quad Pad Type chips having integrated circuit therein at the same time, the probe card comprising: a print circuit board having test circuit so as to test the electrical characteristics of at least two chips at the same time, and having apertures on its center so as to place the chips to be tested; a plurality of needles for probing contact pads formed on the chips with connected on the print circuit board so as to conduct chip testing; a fixing ring installed around the aperture of the print circuit board, and making the needles for chip test connected on the print circuit board with fixed thereby; and a fixing bridge installed near the contact region of two neighboring chips inter-traversing the fixing ring, and fixing some of the needles for probing the contact pads formed close to the line between the two neighboring chips. |
| isCitedBy | http://rdf.ncbi.nlm.nih.gov/pubchem/patent/CN-100414303-C |
| priorityDate | 1997-11-18-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type | http://data.epo.org/linked-data/def/patent/Publication |
Incoming Links
| Predicate | Subject |
|---|---|
| isDiscussedBy | http://rdf.ncbi.nlm.nih.gov/pubchem/substance/SID425762086 http://rdf.ncbi.nlm.nih.gov/pubchem/compound/CID23964 |
Total number of triples: 20.