http://rdf.ncbi.nlm.nih.gov/pubchem/patent/TW-387140-B

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classificationIPCInventive http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L27-108
filingDate 1995-11-28-04:00^^<http://www.w3.org/2001/XMLSchema#date>
grantDate 2000-04-11-04:00^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_b7d18760945203a3e837ad1e2f99d1d5
publicationDate 2000-04-11-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber TW-387140-B
titleOfInvention A manufacturing method for high density stacked capacitor
abstract The invention is a manufacturing method for the capacitor of a stack dynamic random access memory: Stack DRAM. After the insulator is planarized using the chemical mechanical polishing: CMP, we can etch back the polysilicon directly without producing the polysilicon stringer. Therefore, it can form the cavity structure without adding the lithography mask. The high density stacked capacitor can be applied to the 64MB Stack DRAM.
priorityDate 1995-11-28-04:00^^<http://www.w3.org/2001/XMLSchema#date>
type http://data.epo.org/linked-data/def/patent/Publication

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