http://rdf.ncbi.nlm.nih.gov/pubchem/patent/TW-202146917-A
Outgoing Links
| Predicate | Object |
|---|---|
| assignee | http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_8c2600fa93800a915b07e7c529cbdccc |
| classificationIPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-26 |
| filingDate | 2020-06-04-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor | http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_ceef0c1fc37d2495caaf4482fb723f7c http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_0ce2de6b14783491420ea68472808723 |
| publicationDate | 2021-12-16-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber | TW-202146917-A |
| titleOfInvention | IC test circuit board combination and IC test system |
| abstract | An IC test circuit board assembly, which has: a first circuit board with at least one first electrical connection port to connect other components, and at least one IC carrying area to carry at least one IC chip and electrically connect with the at least one IC chip connection; and a second circuit board with at least one second electrical connection port and a plurality of external test pins; wherein, the at least one second electrical connection port is used to electrically connect with the at least one first electrical connection port connected, and the plurality of external test pins are used to provide at least one test signal contact of the IC chip. |
| priorityDate | 2020-06-04-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type | http://data.epo.org/linked-data/def/patent/Publication |
Incoming Links
| Predicate | Subject |
|---|---|
| isDiscussedBy | http://rdf.ncbi.nlm.nih.gov/pubchem/compound/CID23985 http://rdf.ncbi.nlm.nih.gov/pubchem/substance/SID482532689 |
Total number of triples: 13.