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filingDate 2021-04-06-04:00^^<http://www.w3.org/2001/XMLSchema#date>
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publicationDate 2021-11-01-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber TW-202141591-A
titleOfInvention Method for fabricating a semiconductor device
abstract A method and structure for forming semiconductor device includes forming a contact via opening in a first dielectric layer, where the contact via opening exposes a first portion of a contact etch stop layer (CESL). The method further includes etching both the first portion of the CESL exposed by the contact via opening and adjacent lateral portions of the CESL to expose a source/drain contact and form an enlarged contact via opening having cavities disposed on either side of a bottom portion of the enlarged contact via opening. The method further includes forming a passivation layer on sidewall surfaces of the enlarged contact via opening including on sidewall surfaces of the cavities. The method further includes depositing a first metal layer within the enlarged contact via opening and within the cavities to provide a contact via in contact with the exposed source/drain contact.
priorityDate 2020-04-13-04:00^^<http://www.w3.org/2001/XMLSchema#date>
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