| Predicate |
Object |
| assignee |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_b55c349b43c3ecba4977fd52cc8f8c67 |
| classificationCPCAdditional |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N2021-888 |
| classificationCPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G02B5-3033
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N21-892
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G02B5-30 |
| classificationIPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N21-892
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G06K9-62
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/B41J2-01
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G02B5-30 |
| filingDate |
2020-07-20-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_49d1e253bd311920d787ef8f25f278ec
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_8097e7b40bbf70594f6974d84fb26b90
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_fcd18083c95aefd9b52be75abb63dd18
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_741a5927764f5580b847f7655ced282e
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_0b13c416ce79499a1ef53272139c6f4e |
| publicationDate |
2021-06-16-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber |
TW-202122788-A |
| titleOfInvention |
Functional film inspection method, inspection system and material reel |
| abstract |
The subject of the present invention is to provide a functional film inspection method that can properly manage the defect information of the functional film.nThe inspection method of the functional film of the present invention includes: the first step, which is to inspect the long functional film F1 to obtain defect information of the functional film. The long functional film F1 is used for bonding to the long polarizing element or containing the polarizing element The second step is to print the identification information on the width direction end of the functional film at specific intervals in the long side direction of the functional film; and third The step is to associate and memorize the defect information of the functional film and the identification information. |
| priorityDate |
2019-12-10-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type |
http://data.epo.org/linked-data/def/patent/Publication |