| Predicate |
Object |
| assignee |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_fa907cbef2178b7f30a042518be6b17b |
| classificationCPCAdditional |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G11C2029-1204
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G11C2029-5004
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G11C2029-0401
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G11C2029-5006
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G11C29-56 |
| classificationCPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G11C29-56
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G11C29-04
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G11C29-50
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R31-2896
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G11C29-1201
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R31-3183
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R19-0092 |
| classificationIPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-26
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G11C29-08 |
| filingDate |
2019-12-24-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_000fd3b6df884969ff90c652a92d50c9
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_cd2b6151a977a85664805af18f0e80e3
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_aba3cf6b80bc85db8bf3e26530ceb3fa |
| publicationDate |
2021-04-16-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber |
TW-202115737-A |
| titleOfInvention |
Cell current measurement method for three-dimensional memory |
| abstract |
A method for measuring memory cell current of a 3D memory, the method includes applying a first test voltage to a source line pad of a peripheral circuit of a 3D memory device, wherein the source line pad is electrically connected to a common source line of a 3D memory array of the 3D memory device, and the peripheral circuit formed on a first substrate and the 3D memory array formed on a second substrate are electrically connected by direct bonding. The method further includes applying a second test voltage to bit line pads of the 3D memory array, wherein the bit line pads and the 3D memory array are formed on opposite sides of the second substrate. In some embodiments, the method includes applying a second test voltage to a power pad, wherein the power pad is electrically connected to a page buffer of a peripheral circuit. |
| priorityDate |
2019-10-14-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type |
http://data.epo.org/linked-data/def/patent/Publication |