http://rdf.ncbi.nlm.nih.gov/pubchem/patent/TW-202104934-A
Outgoing Links
| Predicate | Object |
|---|---|
| assignee | http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_c5a9791add84989ee56e2233bb12e7bc |
| classificationCPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L27-14661 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01T1-246 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01T1-241 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01T1-244 |
| classificationIPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N23-083 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01T1-16 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01T1-24 |
| filingDate | 2020-03-20-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor | http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_df89b5db55c77c3b4ead79aead567f35 http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_a4a6369609ca22ccff066dab1a3514ea |
| publicationDate | 2021-02-01-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber | TW-202104934-A |
| titleOfInvention | Semiconductor x-ray detector, inspection system, cargo scanning or non-intrusive inspection system, full-body scanner system, x-ray computed tomography system and electron microscope |
| abstract | An apparatus for detecting X-ray, comprising an X-ray absorption layer comprising an electrode, an electronics layer and a wall sealing a space among electrical connections between the X-ray absorption layer and the electronics layer. The electronics layer comprises: a first and second voltage comparators configured to compare a voltage of an electrode to a first and second thresholds respectively; a counter configured to register a number of X-ray photons absorbed by the X-ray absorption layer; and a controller configured to: start a time delay from a time at which an absolute value of the voltage equals or exceeds an absolute value of the first threshold; activate the second voltage comparator during the time delay; cause the number registered by the counter to increase by one, if, during the time delay, an absolute value of the voltage equals or exceeds an absolute value of the second threshold. |
| priorityDate | 2019-03-29-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type | http://data.epo.org/linked-data/def/patent/Publication |
Incoming Links
Total number of triples: 26.