http://rdf.ncbi.nlm.nih.gov/pubchem/patent/TW-202009500-A
Outgoing Links
| Predicate | Object |
|---|---|
| assignee | http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_d6f8707fb268e47a0f14ebf7875f192f http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_38ed56a4b4e8e2315b2b3308bffedb3f |
| classificationIPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-26 |
| filingDate | 2018-08-27-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor | http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_497d200c6a2541284789901cfa590c72 http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_52934f485189b05218a3cf1543e793ce http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_a2e6dcf35101483ecc0569644016d0bd http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_ab14642f21f040ffcfd5ac5b1bbde474 |
| publicationDate | 2020-03-01-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber | TW-202009500-A |
| titleOfInvention | Inspecting device |
| abstract | An inspecting device includes a circuit board, a wiring load board and a strip detecting unit having a shaft spring. The wiring load board has a conductive medium path electrically connected to the circuit board. One part of the outer surface of the shaft spring along its length is fixed to one surface of the wiring load board, and is electrically connected to the conductive medium. When the inspecting device tests a semiconductor component, the shaft spring simultaneously contacts at least two power contacts of the semiconductor component by another part of the outer surface of the shaft spring along its length. |
| isCitedBy | http://rdf.ncbi.nlm.nih.gov/pubchem/patent/TW-I798125-B |
| priorityDate | 2018-08-27-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type | http://data.epo.org/linked-data/def/patent/Publication |
Incoming Links
Total number of triples: 19.