http://rdf.ncbi.nlm.nih.gov/pubchem/patent/TW-201917017-A
Outgoing Links
| Predicate | Object |
|---|---|
| assignee | http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_fcc0b66123940d1b32783569ebfa2d45 |
| classificationCPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/B32B27-18 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G02B1-115 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G02B5-22 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G02B5-28 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G02B5-26 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/B32B7-02 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G02B5-281 |
| classificationIPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G03B11-00 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/C08J7-06 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/B32B27-18 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/B32B27-06 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/B32B9-00 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L27-14 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G02B5-22 |
| filingDate | 2018-07-26-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor | http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_ea8a1f51e53ede95820e409e45164c04 http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_e63b0592668a4aa1b5272e12edb1f8c2 http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_98cb2ae13ebff60e6fdb3f03f7793755 |
| publicationDate | 2019-05-01-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber | TW-201917017-A |
| titleOfInvention | Near-infrared cut filter, manufacturing method thereof, solid-state imaging device and camera module |
| abstract | An object of the present invention is to provide a near-infrared cut-off filter which is excellent in near-infrared cut-off characteristics, has a small incidence angle dependency, and has excellent transmittance characteristics in a visible wavelength region and a multiple reflected light reduction effect in a near-infrared wavelength region. The near-infrared cut filter of the present invention includes a substrate having a transparent resin layer containing a near-infrared absorber, and a dielectric multilayer film formed on at least one side of the substrate, and satisfies the following required condition (a): (A) The value of the shortest wavelength (Xa) at which the transmittance is 50% when measured from the vertical direction of the substrate in the region of 600 nm to 800 nm, and the region of 700 nm to 1200 nm The absolute value | Xa-Xb | of the difference in the longest wavelength value (Xb) when the transmittance is measured from the substrate in the vertical direction is 50% or more. |
| priorityDate | 2017-07-27-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type | http://data.epo.org/linked-data/def/patent/Publication |
Incoming Links
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