Predicate |
Object |
assignee |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_118440443c6e5487c6c08145ac201684 |
classificationCPCAdditional |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G09G3-32 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G09G3-3426 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01J2001-4252 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01J1-42 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L2933-0033 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L2933-0016 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R31-265 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G09G2320-0242 |
classificationCPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01J1-46 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L33-0095 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-67242 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R31-3025 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L33-48 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L22-34 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R31-312 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G09G3-006 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L33-36 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G09G3-3413 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R31-2635 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L22-20 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L22-14 |
classificationIPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-66 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-26 |
filingDate |
2017-12-15-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
inventor |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_0f8c66dd27cc229a4945ea8644ba459d |
publicationDate |
2018-11-16-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
publicationNumber |
TW-201841275-A |
titleOfInvention |
Light-emitting diode (LED) testing device and manufacturing method thereof |
abstract |
The embodiment relates to a functional test method that can be used to make a product including a light emitting diode structure. In particular, a light-emitting diode array that receives current through a current-coupled switch using a field plate includes an electrode and an insulator near the light-emitting diode array. At high output, a control voltage waveform is applied to the field plate electrodes to excite the parallel light-emitting diode devices. A camera records individual light emission phenomena caused by electrical excitation to generate multiple functional tests of light emitting diode devices. Changing the voltage state can excite light-emitting diodes at different current density levels to functionally test additional quantum efficiency and other important device functional parameters. |
isCitedBy |
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-11451714-B2 http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-11474144-B2 http://rdf.ncbi.nlm.nih.gov/pubchem/patent/TW-I759866-B http://rdf.ncbi.nlm.nih.gov/pubchem/patent/TW-I765786-B http://rdf.ncbi.nlm.nih.gov/pubchem/patent/TW-I765337-B |
priorityDate |
2016-12-16-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
type |
http://data.epo.org/linked-data/def/patent/Publication |