Predicate |
Object |
assignee |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_c5a9791add84989ee56e2233bb12e7bc |
classificationCPCAdditional |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01J37-26 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/A61B6-502 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01J2237-24475 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/A61B6-504 |
classificationCPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L31-085 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L27-14676 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L31-08 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L31-02002 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01J37-244 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L31-02016 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L27-1469 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L27-14696 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L31-1832 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/A61B6-035 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01T1-24 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01T1-241 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/A61B6-14 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L31-0224 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L31-02966 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L27-14634 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L27-14636 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L31-186 |
classificationIPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01T1-24 |
filingDate |
2018-04-17-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
inventor |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_a4a6369609ca22ccff066dab1a3514ea http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_df89b5db55c77c3b4ead79aead567f35 |
publicationDate |
2018-11-01-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
publicationNumber |
TW-201839424-A |
titleOfInvention |
Method of manufacturing a semiconductor radiation detector |
abstract |
The invention discloses a device and a method for manufacturing the device. The method includes obtaining a plurality of semiconductor single crystal blocks. Each of the plurality of semiconductor single crystal blocks may have a first surface and a second surface. The second surface may be opposite to the first surface. The method may further include bonding a plurality of semiconductor single crystal blocks to a first semiconductor wafer through respective first surfaces. The plurality of semiconductor single crystal blocks form a radiation absorbing layer. The method further includes forming a plurality of electrodes on respective second surfaces of each of the plurality of semiconductor single crystal blocks, depositing pillars on each of the plurality of semiconductor single crystal blocks, and depositing the plurality of A semiconductor single crystal block is bonded to a second semiconductor wafer through the pillar. |
priorityDate |
2017-04-21-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
type |
http://data.epo.org/linked-data/def/patent/Publication |