http://rdf.ncbi.nlm.nih.gov/pubchem/patent/TW-201831914-A
Outgoing Links
| Predicate | Object |
|---|---|
| assignee | http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_9b18172ba3c278ed85e63a3a5b1db1c0 |
| classificationIPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-26 |
| filingDate | 2017-02-23-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor | http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_23fae9b06dac77946a69b902e15322d4 |
| publicationDate | 2018-09-01-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber | TW-201831914-A |
| titleOfInvention | Mechanism for testing semiconductor products using electrostatic carriers |
| abstract | A mechanism for testing a semiconductor article using an electrostatic carrier is a mechanism for directly testing a static carrier carrying a semiconductor article, the mechanism comprising: a mobile carrier plate configured with at least one electrostatic circuit to apply static electricity The mobile carrier absorbs the semiconductor product carried; a mobile test probe set includes: a probe mechanism including a probe or a plurality of probes; and a mechanical arm for driving the probe mechanism to the required test Pointing and connecting the probe to a circuit contact on the semiconductor article for testing operation; a control mechanism connecting the robot arm, including a control circuit for controlling movement of the robot arm, and a test circuit, the test circuit Extracting the required data through the probe; a computer is connected to the control mechanism for capturing test data of the test circuit; the computer can receive user input to determine a test item and manner of the test circuit and the machine The movement of the arm. |
| priorityDate | 2017-02-23-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type | http://data.epo.org/linked-data/def/patent/Publication |
Incoming Links
Total number of triples: 16.