| Predicate |
Object |
| assignee |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_eae3034a505868e4f55845e3e3667646 |
| classificationIPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-26
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-28 |
| filingDate |
2016-10-24-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_9310747ac054be2de9f33534c5c93183
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_b1bea65209db1a254f63de81ae32ee98
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_b2415ce116b9df06fe76d33afb91fb08 |
| publicationDate |
2018-05-01-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber |
TW-201816404-A |
| titleOfInvention |
Test stand for testing image sensing wafers |
| abstract |
The invention provides a test socket for testing an image sensing wafer, comprising: a test socket frame formed of a plastic material having a low thermal conductivity; and a test frame cover formed by a metal material having a high thermal conductivity. The device is disposed under the test frame; at least one floating plate is disposed in the test frame cover, and the plurality of probes are disposed in the at least one floating plate; at least one heating device is disposed in the test frame cover And at least one probe holder for receiving the probes therethrough. |
| isCitedBy |
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/TW-I726740-B
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/FR-3125885-A1
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/TW-I745775-B
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/EP-4124871-A1 |
| priorityDate |
2016-10-24-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type |
http://data.epo.org/linked-data/def/patent/Publication |