http://rdf.ncbi.nlm.nih.gov/pubchem/patent/TW-201723477-A
Outgoing Links
| Predicate | Object |
|---|---|
| assignee | http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_5ff210e3d78ea49ac26c2ab3ffc01578 |
| classificationCPCAdditional | http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N2030-042 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N2030-025 |
| classificationCPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01J49-10 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N27-623 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N33-0006 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01J49-26 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01J49-0468 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01J49-0027 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N30-7206 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01J49-0009 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N30-02 |
| classificationIPCAdditional | http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01J49-42 |
| classificationIPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N30-86 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G06F17-10 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N30-72 |
| filingDate | 2016-09-12-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor | http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_6788c7fb17d01bf65972804be13904eb http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_ac38f7ded1b594ea52e0740e4bc4e02b |
| publicationDate | 2017-07-01-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber | TW-201723477-A |
| titleOfInvention | Calibration method for generating gas analysis device and gas generation device |
| abstract | The present invention relates to a method of correcting a gas generating device capable of easily correcting a difference in detection sensitivity, a variation in variation, and the like, and quantifying a measurement target with high precision. It is used as a method of correcting a gas generating device that includes a heating unit that generates a gas component by heating a sample, an ion source that ionizes a gas component to generate ions, and a mass spectrometer that detects a gas component and detects a gas component. A standard sample containing a gas component to be measured, (1) correcting the spectral position of the mass spectrum obtained with respect to the gas component of the standard sample, and (2) calculating the actual measurement from the area S of the chromatogram of the gas component of the standard sample and the reference area Ss. The sensitivity correction coefficient Cs=Ss/S at the time of the chromatographic area of the gas component of the sample, and (3) the time t from the maximum peak value of the chromatogram and the reference time ts are calculated in the heating unit when the gas component of the actual sample is measured. The heating correction coefficient H = t / ts at which the heating rate of the sample is corrected. |
| priorityDate | 2015-11-20-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type | http://data.epo.org/linked-data/def/patent/Publication |
Incoming Links
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