http://rdf.ncbi.nlm.nih.gov/pubchem/patent/TW-201705146-A

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filingDate 2016-03-10-04:00^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_1036912048135ab6758a27ee1f293ad1
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publicationDate 2017-02-01-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber TW-201705146-A
titleOfInvention Semiconductor memory device
abstract Embodiments of the present invention provide a semiconductor memory device that can improve operational reliability.nA semiconductor memory device according to an embodiment includes: a first block including a first memory string including a first memory cell and a first selection transistor; and a second block including a second memory cell and a second block Selecting a second memory string of the transistor; a source line electrically connected to the first memory string and the second memory string; and a control unit for programming data writing to the first memory cell During operation, the voltage of the source line is applied to the gate electrode of the second selection transistor.
priorityDate 2015-03-12-04:00^^<http://www.w3.org/2001/XMLSchema#date>
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Total number of triples: 22.