http://rdf.ncbi.nlm.nih.gov/pubchem/patent/TW-201602590-A
Outgoing Links
| Predicate | Object |
|---|---|
| assignee | http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_2106ae8334af9ad6f0b7309092bf31ec |
| classificationIPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R1-073 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-26 |
| filingDate | 2014-07-04-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor | http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_5a1dc36aa1ad23db334403f6d3d4fe25 http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_7b030f6751173c0882d513a194dcf56b |
| publicationDate | 2016-01-16-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber | TW-201602590-A |
| titleOfInvention | Construction of a composite probe array |
| abstract | The present invention relates to the construction of a composite probe array, and more particularly to a configuration of a composite probe array that enhances connection reliability and protects contacts. The composite probe array of the present invention comprises a probe card module and a contact film, wherein the contact film has a plurality of conductive contacts, and an electrical connection can be formed between the probe and the contact of the semiconductor component to be tested. The reliability of the electrical connection is enhanced and the contacts of the semiconductor components are protected. |
| priorityDate | 2014-07-04-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type | http://data.epo.org/linked-data/def/patent/Publication |
Incoming Links
| Predicate | Subject |
|---|---|
| isDiscussedBy | http://rdf.ncbi.nlm.nih.gov/pubchem/substance/SID419559581 http://rdf.ncbi.nlm.nih.gov/pubchem/compound/CID297 |
Total number of triples: 14.