http://rdf.ncbi.nlm.nih.gov/pubchem/patent/TW-201538996-A

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filingDate 2014-10-17-04:00^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_32a771d86bf61fa12db14ecf2b632beb
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publicationDate 2015-10-16-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber TW-201538996-A
titleOfInvention Method and device for non-contact measurement of P-N junction sheet resistor and shunt resistor
abstract The non-contact measuring pn junction has a characteristic of: illuminating one of the surfaces of one of the pn junctions with illumination; and measuring, by a first electrode, the first junction of the first region from the one of the pn junctions a photovoltage (JPV) signal; measuring a second JPV signal from a second region with a second electrode; measuring a third JPV signal from a third region with a reference electrode; and using a corrected first A sheet resistance of the top layer of the pn junction is determined by the JPV signal, the corrected second JPV signal, the corrected first calibration JPV signal, the corrected second calibration JPV signal, or the known sheet resistance of the calibration pn junction.
priorityDate 2013-10-17-04:00^^<http://www.w3.org/2001/XMLSchema#date>
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Total number of triples: 21.