http://rdf.ncbi.nlm.nih.gov/pubchem/patent/TW-201535519-A

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classificationIPCInventive http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-318
filingDate 2015-02-17-04:00^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_9e263b814ca5413ce071527b545ba87a
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publicationDate 2015-09-16-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber TW-201535519-A
titleOfInvention Method for producing nitride film and method for controlling compressive stress of the nitride film
abstract The present invention relates to a method for producing a nitride thin film which stably maintains a film quality by atomic layer deposition and which can easily adjust a compressive stress, and performs a unit period including at least one of the following four steps to form a nitrogen having compressive stress on a substrate. a film, the four steps, comprising: a first step of supplying a source gas to the substrate, at least a portion of the source gas being adsorbed onto the substrate; and a second step of supplying a first purge gas to the substrate; In the third step, a stress adjustment gas containing nitrogen (N2) and a reaction gas containing a nitrogen component (N) other than nitrogen (N2) are simultaneously supplied to the substrate in a plasma state, thereby forming a unit deposition on the substrate. a membrane; and a fourth step of supplying a second purge gas to the substrate.
priorityDate 2014-02-28-04:00^^<http://www.w3.org/2001/XMLSchema#date>
type http://data.epo.org/linked-data/def/patent/Publication

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Total number of triples: 45.